1、 Structural features

2、 Overview
2.1 Basic functions and standards:
The ST2258C multifunctional digital four probe tester is a versatile and intelligent comprehensive measuring instrument that uses the principle of four probe measurement to test material resistivity/block resistance. The design of this instrument complies with GB/T 1551-2009 "Method for Measuring the Resistivity of Silicon Single Crystals", GB/T 1551-1995 "DC Two Probe Method for Measuring the Resistivity of Silicon and Germanium Single Crystals", GB/T 1552-1995 "DC Four Probe Method for Measuring the Resistivity of Silicon and Germanium Single Crystals", and references the American A.S.T.M standard.
2.2 Complete set of instruments: composed of ST2258C four probe host, optional four probe probe, and optional four probe test bench.
2.3 Advantages and characteristics:
1: This tester is equipped with an automatic classification function for test results, which can be classified into 10 categories.
2: Customizable USB communication interface for easy expansion into testing modules in integrated testing systems.
3: 8-speed ultra wide range, industry-leading. Generally, the gear range for peers is five to six.
4: Instrument miniaturization, manual/automatic integration.
5: The instrument is easy to operate and has stable performance. All parameter settings and function conversions are input using digital keyboards, which is simple and eliminates the instability of analog locators.
2.4 Probe Selection: There are multiple options available for probes based on different material characteristics. Please refer to the "Reference Table for Model, Specification, and Feature Selection of Four Probe Probes" for details
1. Equipped with a high wear-resistant tungsten carbide probe, such as the ST2253-F01 type, to test the resistivity/square resistance of hard materials such as semiconductors, metals, and conductive plastics, such as silicon;
2 spherical or flat headed gold-plated copper alloy probe probes without damaging the film, such as ST2558B-F01 type, can measure conductive films such as metal foil and carbon paper, as well as conductive coating films on substrates such as ceramic, glass, or PE film, such as thin film coating resistivity/square resistance of materials such as metal coating, spray coating, ITO film, capacitance convolution film, etc.
Equipped with a dedicated foil coating probe, such as the ST2558B-F02 model, it can also test the resistivity/square resistance of foil coating on lithium battery electrodes and other materials.
Replace it with a four terminal testing fixture and measure the body resistance of the resistor..
2.5 Test bench selection: According to different material characteristics, there are multiple options available for the test bench. For details, please refer to the "Reference Table for Model, Specification, and Feature Selection of Four Probe Test Bench"
The four probe method is used to test solid or thin film materials, and SZT-C type (fast constant voltage), or SZT-F type (solar cell) test bench is selected.
Select SZT-K type testing bench for testing slender rod materials using the two probe method
SZT-G type testing bench is selected for testing rubber and plastic materials using the parallel four blade method.
2.6 Scope of application: The instrument is suitable for testing the conductivity of conductors, semiconductors, and semiconductor like materials using the four probe method in semiconductor material factories, research institutions, and universities.

三、基本技术参数

1. Measurement range and resolution (in parentheses, it can be expanded downwards by one order of magnitude)
Resistance: 10.0 × 10^-6~200.0 × 10³ Ω,    resolution 1.0 × 10^-6~0.1 × 10³ Ω
(1.0 × 10^-6~20.00 × 10³ Ω,    resolution 0.1 × 10^-6~0.01 × 10³ Ω)
Resistivity: 10.0 × 10^-6~200.0 × 10³ Ω cm    resolution 1.0 × 10^-6~0.1 × 10³ Ω cm
(1.0 × 10^-6~20.00 × 10³ Ω cm    resolution 0.1 × 10^-6~0.01 × 10³ Ω cm)
Block resistance: 50.0 × 10^-6~900.0 × 10³ Ω/□    Resolution 5.0 × 10^-6~0.5 × 10³ Ω/□
(5.0 × 10^-6~100.0 × 10³ Ω/□    Resolution 0.5 × 10^-6~0.1 × 10³ Ω/□)
2. Material size (determined by the optional testing bench and testing method)
Diameter: SZT-C/F square test bench direct testing method 180mm × 180mm, unlimited handheld mode
Length (height): Test bench direct testing method H ≤ 100mm, handheld method is not limited
Measurement orientation: both axial and radial
3.3 Range division and error level

3.4 Four probe probes (optional or all)
(1) Tungsten carbide probe: Φ 0.5mm, linear probe spacing 1.0mm, probe pressure adjustable from 0 to 2kg
(2) Thin film square resistance probe: Φ 0.7mm, straight or square probe spacing 2.0mm, probe pressure adjustable from 0 to 0.6kg
3.5. Power supply
Input: AC 220V ± 10%, 50Hz Power consumption:<20W
3.6. Overall dimensions and weight:
Host: 220mm (length) × 245 mm (width) × 100mm (height), net weight: ≤ 2.5kg