1、 Structural features

2、 Overview
2.1 Basic functions and standards:
The ST2253 digital four probe tester is a versatile and intelligent comprehensive measuring instrument that uses the principle of four probe measurement to test material resistivity/block resistance. The design of the instrument conforms to GB/T 1551-2021 "Determination of Resistivity of Silicon Single Crystal - In-line Four-Probe Method and DC Two-Probe Method", GB/T26074-2010 "Germanium Single Crystal Resistivity DC Four-Probe Measurement Method" and other national standards, and refer to the American standard ASTM F1711-96 to use the four-point detection method to determine the professional flat panel display Standard procedure for thin-film resistors for thin-film wires for indicators.
2.2 Complete instrument composition: composed of ST2253 four probe host, optional four probe probe, four probe test bench, and ST2253 four probe testing software.
2.3 Advantages and characteristics:
1) Equipped with computer software, it can save, query, statistically analyze data, and print reports. Works with domestic patent rights, patent number: Ruanzhudengzi No. 07928553
2) USB communication interface, with good universality and convenience. Compared to RS232 or 485 methods, these ports are generally difficult to configure on computers!
3) 8-speed ultra wide range, industry-leading. Generally, the gear range for peers is five to six.
4) It can be operated independently from a computer, with miniaturization and integrated manual/automatic operation.
5) Easy to operate and stable in performance, all parameter settings and function conversions use digital switch inputs, which is simple and reliable, and eliminates the instability and interference of analog potentiometers.
2.4 Probe Selection: There are multiple options available for probes based on different material characteristics. Please refer to the "Reference Table for Model, Specification, and Feature Selection of Four Probe Probes" for details
1) Equipped with highly wear-resistant tungsten carbide probe probes, such as the ST2253-F01 type, to test the resistivity/square resistance of hard materials such as semiconductors, metals, and conductive plastics such as silicon;
2) A spherical or flat headed gold-plated copper alloy probe probe without damaging the film, such as the ST2558B-F01 type, can measure the resistivity/square resistance of thin film coatings on metal foil, carbon paper, and other conductive films, as well as ceramic, glass, or PE film substrates, such as metal coating, spray coating, ITO film, capacitance convolution film, and other materials.
3) Equipped with a dedicated foil coating probe, such as the ST2558B-F02 model, it can also test the resistivity/square resistance of foil coating on lithium battery electrodes and other materials.
4) Replacing with a four terminal test fixture can also measure the body resistance of the resistor.
2.5 Test bench selection: According to different material characteristics, there are multiple options available for the test bench. For details, please refer to the "Reference Table for Model, Specification, and Feature Selection of Four Probe Test Bench"
The four probe method is used to test solid or thin film materials, and SZT-B type (electric), SZT-C type (fast constant voltage), or SZT-F type (solar cell) test bench is selected.
Select SZT-K type testing bench for testing slender rod materials using the two probe method
SZT-G type testing bench is selected for testing rubber and plastic materials using the parallel four blade method.

3、 Basic technical parameters
3.1 Measurement range
Resistance: 1.0×10^-6～200.0×10³ Ω, resolution: 1.0×10^-6 ～0.1×10³ Ω
(1.0×10^-6～ 20.00×10³ Ω, resolution: 0.1×10^-6 ～0.01×10³ Ω)

(100×10^-6～ 2.000×10⁶ Ω, resolution: 10×10^-6 ～0.1×10³ Ω)
Resistivity: 10.0× 10^-6 × 200 x 10³ Ω cm, resolution: 1.0 × 10^-6 ～ 0.1 x 10³ Ω cm
Square resistance: 50.0 × 10^-6 ～1.0 x 10⁶ Ω/□, resolution: 5.0 × 10^-6 ～0.5 x 10³ Ω/□
3.2 Material dimensions (determined by the optional testing bench and testing method)
Diameter: SZT-C/F test bench direct testing method 180mm × 180mm, unlimited handheld mode.
Length (height): Test bench direct testing method H ≤ 100mm, handheld method is not limited.
Measurement orientation: both axial and radial
3.3 Range division and error level