1、 Overview of functional and structural features

Basic function: SZT-L resistivity testing platform, used to clamp wire and cable samples (circular or square cross-section), connect four
A probe testing instrument or milliohmmeter, used for conducting four terminal resistivity testing. It is a combination of four terminal method resistivity testing instruments
Set of measuring devices (hereinafter referred to as test bench). Design in accordance with GBT 3048.2-94 Electrical Performance Test Method for Wire and Cable_ metal
Conductive material resistivity test.
Basic composition: The test bench mainly consists of a base plate, horizontal movement of voltage cutting tools, and left and right sample clamping units.
Matching and compatibility: This test bench is equipped with a four terminal method connection port, which is compatible with most of our company's four probe testing instruments or millimeters
Ouji can also be connected to a double arm bridge.
2、 Basic parameters and measurable semiconductor material dimensions
Voltage blade pitch: 100mm to 1000mm adjustable
Measurable sample: diameter or side length: circular cross-section ≤ Φ 30mm or ≤ 30mm × 30mm square section.
Length: Clamping method at both ends, L ≥ 1100mm
Measurement orientation: axial (length direction).
3、 Contact information: 18914021918/0512-80973697/66050595 (fax) QQ: 1064887318 Mr. Ding